Machine See, Machine Do: How Technology Mirrors Bias in Our Criminal Justice System

Available

Product Details

Price
$16.98  $15.79
Publisher
New Degree Press
Publish Date
Pages
254
Dimensions
5.5 X 8.5 X 0.53 inches | 0.66 pounds
Language
English
Type
Paperback
EAN/UPC
9781637308219

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About the Author

Patrick K. Lin is a New York City-based author focused on researching technology law and policy, artificial intelligence, surveillance, and predictive algorithms. He has worked for a variety of public interest organizations, including the ACLU's Speech, Privacy & Technology Project, the Federal Trade Commission, and the Electronic Frontier Foundation. Previously, he interned for federal judges in the Eastern District of New York and the Southern District of New York.